Title: A Cambrian Explosion in Robust Computing Systems is Dead Ahead

Speaker: Subhasish Mitra

Abstract: Today’s test practices, which mostly serve 20th-century manufacturing needs, cannot meet the levels of thoroughness demanded by today’s (and future) systems. This creates golden opportunities for new “System-Driven” approaches – from extremely thorough testing, deemed impossible today, in the field all the way to cost-effective tolerance and prediction of failures in hardware during system operation.

Keynote

Corporate Vice President, General Manager, Data Center and AI Product Management, Intel Corporation

Dr. Zane A. Ball is a Corporate Vice President and General Manager of the Data Center and AI (DCAI) Product Management Group. DCAI Product Management is responsible for end-to-end stewardship of DCAI’s systems, SW, CPU, GPU, and custom product line through the entirety of the product lifecycle.  Prior to his product management role, Ball was CVP and GM of platform engineering and architecture for Intel’s data center business.  Ball has also served as Co-GM of Intel’s foundry effort as a VP in the Technology and Manufacturing group and VP of the Client Computing Group including roles as GM of the desktop client business and as GM of global customer engineering.

Ball has a bachelor’s degree, master’s degree, and Ph.D. in electrical engineering, all earned from Rice University.  He also holds six patents in high-speed electrical design.