Title: The Role of Abstraction and Modeling in the Assessment of Hardware Faults Effects

Speaker: Dimitris Gizopoulos 

Abstract:

System measurements and information logging at scale provide valuable insights on how silicon faults can affect the operation of user and system workloads. However, fine-grain information on the hardware units or the software pieces that are offended by the faults is a time and resource consuming process with uncertain success. We discuss the role of abstraction and modeling of computing chips (simulation and emulation) in measuring and characterizing the system-level effects of faults; information granularity, throughput, accuracy.

Keynote

Corporate Vice President, General Manager, Data Center and AI Product Management, Intel Corporation

Dr. Zane A. Ball is a Corporate Vice President and General Manager of the Data Center and AI (DCAI) Product Management Group. DCAI Product Management is responsible for end-to-end stewardship of DCAI’s systems, SW, CPU, GPU, and custom product line through the entirety of the product lifecycle.  Prior to his product management role, Ball was CVP and GM of platform engineering and architecture for Intel’s data center business.  Ball has also served as Co-GM of Intel’s foundry effort as a VP in the Technology and Manufacturing group and VP of the Client Computing Group including roles as GM of the desktop client business and as GM of global customer engineering.

Ball has a bachelor’s degree, master’s degree, and Ph.D. in electrical engineering, all earned from Rice University.  He also holds six patents in high-speed electrical design.