{"id":244,"date":"2024-06-02T14:57:59","date_gmt":"2024-06-02T14:57:59","guid":{"rendered":"https:\/\/ieee-ras.conferences.computer.org\/2024\/?page_id=244"},"modified":"2024-06-02T14:58:42","modified_gmt":"2024-06-02T14:58:42","slug":"invited_talk_vilas_sridharan_abstract","status":"publish","type":"page","link":"https:\/\/ieee-ras.conferences.computer.org\/2024\/invited_talk_vilas_sridharan_abstract\/","title":{"rendered":"Invited_talk_Vilas_Sridharan_Abstract"},"content":{"rendered":"\t\t<div data-elementor-type=\"wp-page\" data-elementor-id=\"244\" class=\"elementor elementor-244\" data-elementor-post-type=\"page\">\n\t\t\t\t<div class=\"elementor-element elementor-element-27c38ab e-flex e-con-boxed e-con e-parent\" data-id=\"27c38ab\" data-element_type=\"container\" data-e-type=\"container\">\n\t\t\t\t\t<div class=\"e-con-inner\">\n\t\t\t\t<div class=\"elementor-element elementor-element-b7a4258 elementor-widget elementor-widget-text-editor\" data-id=\"b7a4258\" data-element_type=\"widget\" data-e-type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t<p><strong>Title: <\/strong>Addressing emerging fault modes with testing and reliability<\/p><p><strong>Speaker: Vilas Sridharan<\/strong><\/p><p><strong>Abstract: <\/strong>This talk will cover the challenges, current state, and future directions of addressing emerging fault modes with testing and reliability features.<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t","protected":false},"excerpt":{"rendered":"<p>Title: Addressing emerging fault modes with testing and reliability Speaker: Vilas Sridharan Abstract: This talk will cover the challenges, current state, and future directions of addressing emerging fault modes with testing and reliability features.<\/p>\n","protected":false},"author":4,"featured_media":0,"parent":0,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"elementor_canvas","meta":{"footnotes":""},"class_list":["post-244","page","type-page","status-publish","hentry"],"_links":{"self":[{"href":"https:\/\/ieee-ras.conferences.computer.org\/2024\/wp-json\/wp\/v2\/pages\/244","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/ieee-ras.conferences.computer.org\/2024\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/ieee-ras.conferences.computer.org\/2024\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/ieee-ras.conferences.computer.org\/2024\/wp-json\/wp\/v2\/users\/4"}],"replies":[{"embeddable":true,"href":"https:\/\/ieee-ras.conferences.computer.org\/2024\/wp-json\/wp\/v2\/comments?post=244"}],"version-history":[{"count":0,"href":"https:\/\/ieee-ras.conferences.computer.org\/2024\/wp-json\/wp\/v2\/pages\/244\/revisions"}],"wp:attachment":[{"href":"https:\/\/ieee-ras.conferences.computer.org\/2024\/wp-json\/wp\/v2\/media?parent=244"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}