{"id":264,"date":"2024-06-03T03:29:38","date_gmt":"2024-06-03T03:29:38","guid":{"rendered":"https:\/\/ieee-ras.conferences.computer.org\/2024\/?page_id=264"},"modified":"2024-06-03T03:31:32","modified_gmt":"2024-06-03T03:31:32","slug":"invited_talk_dimitris_gizopoulos_abstract","status":"publish","type":"page","link":"https:\/\/ieee-ras.conferences.computer.org\/2024\/invited_talk_dimitris_gizopoulos_abstract\/","title":{"rendered":"Invited_talk_Dimitris_Gizopoulos_Abstract"},"content":{"rendered":"\t\t<div data-elementor-type=\"wp-page\" data-elementor-id=\"264\" class=\"elementor elementor-264\" data-elementor-post-type=\"page\">\n\t\t\t\t<div class=\"elementor-element elementor-element-ffa448d e-flex e-con-boxed e-con e-parent\" data-id=\"ffa448d\" data-element_type=\"container\" data-e-type=\"container\">\n\t\t\t\t\t<div class=\"e-con-inner\">\n\t\t\t\t<div class=\"elementor-element elementor-element-890f4fe elementor-widget elementor-widget-text-editor\" data-id=\"890f4fe\" data-element_type=\"widget\" data-e-type=\"widget\" data-widget_type=\"text-editor.default\">\n\t\t\t\t<div class=\"elementor-widget-container\">\n\t\t\t\t\t\t\t\t\t<p><strong>Title: The Role of Abstraction and Modeling in the Assessment of Hardware Faults Effects<\/strong><\/p><p><strong>Speaker: Dimitris Gizopoulos\u00a0<\/strong><\/p><p><strong>Abstract:<\/strong><\/p><p>System measurements and information logging at scale provide valuable insights on how silicon faults can affect the operation of user and system workloads. However, fine-grain information on the hardware units or the software pieces that are offended by the faults is a time and resource consuming process with uncertain success. We discuss the role of abstraction and modeling of computing chips (simulation and emulation) in measuring and characterizing the system-level effects of faults; information granularity, throughput, accuracy.<\/p>\t\t\t\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t\t\t<\/div>\n\t\t","protected":false},"excerpt":{"rendered":"<p>Title: The Role of Abstraction and Modeling in the Assessment of Hardware Faults Effects Speaker: Dimitris Gizopoulos\u00a0 Abstract: System measurements and information logging at scale provide valuable insights on how silicon faults can affect the operation of user and system workloads. However, fine-grain information on the hardware units or the software pieces that are offended [&hellip;]<\/p>\n","protected":false},"author":4,"featured_media":0,"parent":0,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"elementor_canvas","meta":{"footnotes":""},"class_list":["post-264","page","type-page","status-publish","hentry"],"_links":{"self":[{"href":"https:\/\/ieee-ras.conferences.computer.org\/2024\/wp-json\/wp\/v2\/pages\/264","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/ieee-ras.conferences.computer.org\/2024\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/ieee-ras.conferences.computer.org\/2024\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/ieee-ras.conferences.computer.org\/2024\/wp-json\/wp\/v2\/users\/4"}],"replies":[{"embeddable":true,"href":"https:\/\/ieee-ras.conferences.computer.org\/2024\/wp-json\/wp\/v2\/comments?post=264"}],"version-history":[{"count":0,"href":"https:\/\/ieee-ras.conferences.computer.org\/2024\/wp-json\/wp\/v2\/pages\/264\/revisions"}],"wp:attachment":[{"href":"https:\/\/ieee-ras.conferences.computer.org\/2024\/wp-json\/wp\/v2\/media?parent=264"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}